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Figure shows the FFT of typical seizure and normal EEG patterns used for training and testing of the ANN. X-axis represents the fraction between EEG frequency and the sampling frequency (256). Y-axis represents the relative power of seizure and normal EEG. The input layer of ANN contains 40 nodes weighted for training and testing of seizure and normal EEG patterns, selected from digital values of FFT between points 'a' to 'b', i.e. FFT data from 10 Hz to 30 Hz.

Figure shows the FFT of typical seizure and normal EEG patterns used for training and testing of the ANN. X-axis represents the fraction between EEG frequency and the sampling frequency (256). Y-axis represents the relative power of seizure and normal EEG. The input layer of ANN contains 40 nodes weighted for training and testing of seizure and normal EEG patterns, selected from digital values of FFT between points 'a' to 'b', i.e. FFT data from 10 Hz to 30 Hz.